Fully Automatic Coagulation Analyzer SF-8050

Features

1. Inductive dual magnetic circuit, immune turbidimetric and chromogenic substrate methods inside each channel.
2. Up to 200 tests/hour throughput with 1000 continuous cuvettes loading system.
3. Dual-way HIS/LIS connection and IC card reagents / consumables protection.
4. Intelligent dual independent probes with temperature control and liquid surface induction.
5. Systematic original, reagents, quality controls and calibrators cover full range of use.

Specifications

1. Testing Method: Clotting, Immune turbidimetric and Chromogenic substrate methods.
2. Testing Items: PT, APTT, FIB, TT, HEP, LMWH, PC, PS and various types of factors, D-Dimer, FDP, AT-III.
3. Throughput: PT: 200 tests per hour
4. CV: <3%
5. Pre-heating Positions: 10
6. Reagent Positions: 16
7. Sample Positions: 30, interchangeable and extensible sample rack compatible to any tube
8. Cuvettes: 1000 continuous cuvettes loading
9. Port: USD and RS232
10. Data Transmission: Dual way, HIS/LIS supported

Multiple Test Methods

-Inductive dual magnetic circuit method makes use of elector-magnetic fields

-No disruptions from icterus, hemolysis, chyles and turbid particles

-3 test methods of Clotting, Immun turbidimetric and Chromogenic substrate

-Multiple wavelength compatible for various test items including D-Dimer, FDP and AT-III

-4 mechanical plus 2 optical test channels

Intelligent Dual Independent Probes

-Dual separate cleaning system avoids cross-contamination

-High-speed inside 37℃ pre-heating with automatic temperature control

-Liquid surface induction inside probes

Comprehensive Reagents Management

-Extensible reagent positions, available for various reagent vials

-16℃ temperature control and automatic stirring of reagent positions

-IC card reagent and consumable protection and barcode control system

High Throughput and Wonderful Solution

-1000 continuous cuvettes give no test suspending for cuvettes feeding

-Up to 200 PTs/hour and 25 samples/hour of mixed items

-Emergency test on any position

-Dual-way LIS/HIS connection